Facilities

All users must be authorized by Professor Xing or Professor Jena. All users must be trained by one of the following personnel: Professor Xing, Professor Jena, Dr. Vlad Protasenko, Dr. Kazuki Nomoto, or authorized super-users in the Jena-Xing group. The lab policies and operational manuals are posted on the Group Folder on Box. All users are re-authorized annually to access facilities in the Jena-Xing group.

(Group equipment not listed below is on a first-come first-served basis.)

I-Epitaxy

            The Jena-Xing laboratory currently has a few molecular beam epitaxy (MBE) systems. They are dedicated to growth of device-quality GaN material systems (Gen10), Ga2O3 material systems (Gen930), high-temperature AlN and boron-containing material systems (Xplor), layered material systems and GaAs materials systems (two connected Gen-II systems).

            Group members, please use this website to sign in for growths on each system and check system status.

Present super-users:
Gen10: (Sign-In) Dr. Vlad Protasenko, Dr. Moudud Islam
GenXplor: (Sign-In) Dr. Vlad Protasenko, Dr. Moudud Islam, Dr. YoungJin Cho
Gen930: (Sign-In) Dr. Vlad Protasenko, Dr. Moudud Islam
GenII: (Sign-In) Brian Schutter, Suresh Vishwanath, Alex Chaney
GenII III-V: (Sign-In) Brian Schutter, Suresh Vishwanath, Alex Chaney

 

Cascade 11000 probe station coupled with Keithley 4200 probe station in Duffield Hall

 

High voltage and high current Signatone probe station coupled with Agilent 1500B sourcemeter in Duffield Hall

 

PANalytical X'Pert PRO high resolution X-Ray Diffraction (XRD) unit in Duffield Hall

 

Veeco GEN10 Molecular Beam
Epitaxy unit in Duffield Hall

 

 

II-Structural Characterization

The Jena-Xing laboratory currently has a XRD system.

Group members, please use this website to sign in to reserve the system and check system status.

Present super-users:
XRD: (Sign-In) Dr. Vlad Protasenko, Dr. Moudud Islam, Hanjong Paik

III-Electrical Characterization

The Jena-Xing laboratory currently has an array of equipment for temperature-dependent frequency-dependent I-V and C-V measurements.

Group members, please use this website to sign in to reserve the appropriate system and check system status.

  • General purpose Probe Station: (Sign-In) (first-come first-served)
  • Cascade Semiautomatic Probe Station: (Sign-In) with micro chamber (N2 purge to minimize effect of moisture, blackbox to minimize effect of room light) and femto-amp resolution and femto-farad stray capacitance 

Present super-users:
Dr. Vlad Protasenko, Dr. Kazuki Nomoto, Dr. Zongyang Hu, Rusen Yan

  • Signatone High-voltage High-current Probe Station: (Sign-In)  for RT-300 C (if your device resistance is > 10 ohm, please use other probe stations)

Present super-users: 
Dr. Kazuki Nomoto, Dr. Zongyang Hu, Wenshen Li

  • Lakeshore DC-RF Probe Station: (Sign-In) for 4K-350K

Present super-users: 
Dr. Vlad Protasenko, Dr. Kazuki Nomoto, Dr. Zongyang Hu, Rusen Yan

Present super-users: 
Dr. Kazuki Nomoto, Wenshen Li

IV-Optical Characterization

  • WiTec Confocal Raman Microscope: (Sign-In)

Present super-users: 
Dr. Vlad Protasenko, Rusen Yan

Present super-users: 
Dr. Vlad Protasenko